Academic Achievements
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
Jun 3, 2021 |
  • Journal:
     2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
  • Document Code:
     SR3391
  • Page Number:
     170-177
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2013