Academic Achievements
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
Jun 7, 2021 |
  • Journal:
     20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2015
  • Document Code:
     SY123982
  • Page Number:
     652-657
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2015