Academic Achievements
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
Jun 10, 2021 |
  • Journal:
     IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
  • Document Code:
     SY128670
  • Volume:
     25
  • Issue:
     3
  • Page Number:
     806-819
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2017