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严昌浩
教授
Supervisor of Doctorate Candidates
Name (Pinyin):Yan Changhao
Date of Birth:1974-05-16
E-Mail:yanch@fudan.edu.cn
Date of Employment:2006-07-01
School/Department:集成电路与微纳电子创新学院
Education Level:研究生毕业
Business Address:上海浦东新区张衡路825号(复旦大学张江校区)微电子楼207
Gender:Male
Degree:博士学位
Professional Title:教授
Status:Employed
Academic Titles:科研人员
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Academic Achievements
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis
Jun 10, 2021
|
Journal:
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Document Code:
SY128670
Volume:
25
Issue:
3
Page Number:
806-819
Translation or Not:
no
Date of Publication:
Jan 1, 2017
Pre One: Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation
Next One: Provably Good and Practically Efficient Algorithms for CMP Dummy Fill