Academic Achievements
Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation
Dec 23, 2021 |
  • Journal:
     IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
  • Document Code:
     HS10811
  • Volume:
     41
  • Issue:
     1
  • Page Number:
     1-14
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2022