张祥朝
( 研究员
博士生导师
)
- 教师英文名称：Xiangchao Peter Zhang
- 教师拼音名称：Zhang Xiangchao
- 所在单位：未来信息创新学院
- 职务：工程中心副主任，教研室副主任，教学团队负责人
- 学历：研究生毕业
- 办公地点：复旦大学江湾校区交叉二号楼C3013
- 性别：男
- 学位：博士学位
- 在职信息：在职
- 主要任职：教师
- 邮编：200438
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- 传真：021-31242566
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- 通讯/办公地址：上海市杨浦区淞沪路2205号交叉二号楼C3013
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- 邮箱：zxchao@fudan.edu.cn
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- 张祥朝；牛兴漫；郝思远；郎威；李坪峰；刘瑞阳；张宗华,光学曲面的偏折测量技术：原理、挑战与展望（特邀）.-光学精密工程-2025-01-01-33
- Chen, Yunuo；Lang, Wei；Chen, Ting；Niu, Xingman；Zhang, Xiangchao,Enhancing the efficiency and determinacy of in-situ monoscopic phase measuring deflectometry by Bayesian approach.-PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY-2025-01-01-94
- Zhang, Xiangchao；Ma, Xinyang；Rong, Shuangquan,Physics-informed and self-supervised multi-image super-resolution reconstruction for digital holography microscopy.-Surface Topography: Metrology and Properties-2025-01-01-13
- Hua, Zhijie；Zhang, Xu；Tu, Dawei；Zhang, Xiangchao,Three-Dimensional Topography Measurement for Confocal Microscopy With Arrayed Laser Spots.-IEEE Transactions on Instrumentation and Measurement-2025-01-01-74
- Ye, Lu；Zhang, Xiangchao；Xu, Min；Wang, Wei,Design and Calibration of a Slit Light Source for Infrared Deflectometry.-Sensors-2025-01-01-25
- Hu, Dongyang；Wang, Chen；Li, Di；Xu, Weiyu；Zhang, Xiangchao,Vibration Deformation Measurement and Defect Identification Based on Time-Averaged Digital Holography.-Photonics-2025-01-01-12
- Lang, Wei；Zhang, Xiangchao；Chen, Yunuo；Chen, Ting；Yang, Peide；Xu, Min；Jiang, Xiangqian,Deterministic form-position deflectometric measurement of monolithic multi-freeform optical structures via Bayesian multisensor fusion.-Light: Advanced Manufacturing-2025-01-01-6
- Zhang, Xiangchao；Niu, Xingman；Hao, Siyuan；Lang, Wei；Li, Pingfeng；Liu, Ruiyang；Zhang, Zonghua,光学曲面的偏折测量技术：原理、挑战与展望.-Guangxue Jingmi Gongcheng/Optics and Precision Engineering-2025-01-01-33
- Chen, Yunuo；Zhang, Xiangchao；Lang, Wei；Chen, Ting；Niu, Xingman；Jiang, Xiangqian,Beam phase measuring deflectometry featuring physics-compliant object-image mapping.-APL Photonics-2025-01-01-10
- Yang, Peide；Chen, Ting；Wang, Dongfang；Ye, Lu；Chen, Yunuo；Lang, Wei；Zhang, Xiangchao,Recognition and separation of fringe patterns in deflectometric measurement of transparent elements based on empirical curvelet transform.-Measurement: Journal of the International Measurement Confederation-2024-01-01-237
