Academic Achievements
Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation
Oct 14, 2021 |
  • Journal:
     ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
  • Document Code:
     SY133758
  • Volume:
     21
  • Issue:
     1
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2015