Academic Achievements
Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation
Dec 9, 2021 |
  • Journal:
     PROCEEDINGS OF THE 2019 56TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)
  • Document Code:
     SY133997
  • Translation or Not:
     no
  • Date of Publication:
     Jan 1, 2019