张祥朝
( 研究员
博士生导师
)
- 教师英文名称：Xiangchao Peter Zhang
- 教师拼音名称：Zhang Xiangchao
- 所在单位：未来信息创新学院
- 职务：工程中心副主任，教研室副主任，教学团队负责人
- 学历：研究生毕业
- 办公地点：复旦大学江湾校区交叉二号楼C3013
- 性别：男
- 学位：博士学位
- 在职信息：在职
- 主要任职：教师
- 邮编：200438
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- 传真：021-31242566
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- 通讯/办公地址：上海市杨浦区淞沪路2205号交叉二号楼C3013
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- 邮箱：zxchao@fudan.edu.cn
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- Zhou, Lihong；Zhang, Xiangchao；Zhang, Qiangang；Li, Shaoliang；Zhao, Wanliang,Automatic robotic trajectory planning assisted by laser projection measurement.-Proceedings of SPIE - The International Society for Optical Engineering-2022-01-01-12319
- Xiong, Rui；Zhang, Xiangchao；Ma, Xinyang；Qi, Lili；Li, Leheng；Jiang, Xiangqian,Enhancement of Imaging Quality of Interferenceless Coded Aperture Correlation Holography Based on Physics-Informed Deep Learning.-PHOTONICS-2022-01-01-9
- Wang, Jian；Peng, Lihua；Zhai, Fuqi；Tang, Dawei；Gao, Feng；Zhang, Xiangchao；Chen, Rong；Zhou, Liping；Jiang, Xiangqian Jane,Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement.-OPTICS EXPRESS-2023-01-01-31
- Hu, Zhifei；Zhang, Xiangchao；Lang, Wei；Chen, Yunuo；Chen, Ting；Xu, Min,Fast Measurement of Surface Topographies Using a Phase-Measuring Deflectometric Microscopy.-IEEE PHOTONICS JOURNAL-2023-01-01-15
- 朱睿；张祥朝；李绍良；赵万良；陈雨诺；郎威；徐敏,基于单目偏折术的半球谐振子面域振型测量.-飞控与探测-2022-01-01-5
- Lang, Wei；Zhang, Xiangchao；Chen, Yunuo；Chen, Ting；Hu, Zhifei；Jiang, Xiangqian,A General Reconstruction Framework for Deflectometric Measurement Based on Nonuniform B-Splines.-IEEE Transactions on Instrumentation and Measurement-2023-01-01-72
- Wang, Chen；Wang, Weikang；Wei, Jiasi；Wu, Junjie；Zhang, Xiangchao；Zheng, Huadong；Wang, Famin；Yu, Yingjie,Phase-based reconstruction optimization method for digital holographic measurement of microstructures.-APPLIED OPTICS-2023-01-01-62
- Ma, Xinyang；Xiong, Rui；Wang, Wei；Zhang, Xiangchao,Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.-SENSORS-2023-01-01-23
- 叶璐；张祥朝；王军华；徐敏；郑列华,基于外置光阑针孔相机的高精度偏折测量技术.-光子学报-2023-01-01-52
- Chen, Ting；Yang, Peide；Lang, Wei；Chen, Yunuo；Wang, Wei；Zhang, Xiangchao,Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry.-Surface Topography: Metrology and Properties-2024-01-01-12
