学术成果
- High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis.-IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-2017-01-01-25
- Provably Good and Practically Efficient Algorithms for CMP Dummy Fill.-DAC: 2009 46TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2-2009-01-01
- Layout decomposition co-optimization for hybrid e-beam and multiple patterning lithography.-20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2015-2015-01-01
- Efficient Multiple Starting Point Optimization for Automated Analog Circuit Optimization via Recycling Simulation Data.-PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE)-2016-01-01
- A New Method for Multiparameter Robust Stability Distribution Analysis of Linear Analog Circuits.-2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)-2011-01-01
- Efficient Approximation Algorithms for Chemical Mechanical Polishing Dummy Fill.-IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS-2011-01-01-30
- Yield-Driven Clock Skew Scheduling for Arbitrary Distributions of Critical Path Delays.-IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES-2012-01-01-E95-A
- Layout Decomposition with Pairwise Coloring for Multiple Patterning Lithography.-2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)-2013-01-01
- Post-routing layer assignment for double patterning with timing critical paths consideration.-INTEGRATION-THE VLSI JOURNAL-2013-01-01-46
- An efficient method for gradient-aware dummy fill synthesis.-INTEGRATION-THE VLSI JOURNAL-2013-01-01-46
