蒋玉龙中文主页--论文成果

教授

所在单位：微电子学院
学历：研究生毕业
性别：男
学位：博士学位
职称：教授
在职信息：在职
学科：微电子学与固体电子学

论文成果

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[61] Piezoresponse force microscopy study on ferroelectric polarization of ferroelectric polymer thin ... -AIP Advances -2015-01-01 -5
[62] ELECTRICAL PROPERTIES OF ORGANIC FIELD-EFFECT TRANSISTORS BASED ON RIBBON-LIKE TIPS-PENTACENE CRY... -2016 13Th IEEE International Conference on Solid-State and Integrated Circuit Technology(Icsict) Proceedings -2016-01-01
[63] INFLUENCE OF TRENCH OXIDE ON SCHOTTKY BARRIER HEIGHT FOR TISIX/SI POWER DIODE -2016 13Th IEEE International Conference on Solid-State and Integrated Circuit Technology(Icsict) Proceedings -2016-01-01
[64] Observation of Contact Resistivity Independence from Schottky Barrier Height on Heavily Doped P-t... -2016 13Th IEEE International Conference on Solid-State and Integrated Circuit Technology(Icsict) Proceedings -2016-01-01
[65] Improved Thermal Stability of Ferroelectric Phase in Epitaxially Grown P(VDF-TrFE) Thin Films -Macromolecules -2016-01-01 -49
[66] Epitaxy of Ferroelectric P(VDF-TrFE) Films via Removable PTFE Templates and Its Application in Se... -ACS Applied Materials and Interfaces -2017-01-01 -9
[67] Influence of Poly(methyl metacrylate) Addition on Resistive Switching Performance of P3HT/P(VDF-T... -Chinese Journal of Chemical Physics -2017-01-01 -30
[68] Dissipative particle dynamics simulation of phase separation in semiconducting/ferroelectric blen... -Polymer -2017-01-01 -116
[69] Highly selective etch of silicon dioxide with tungsten hard mask deposited by PVD process -2018 18TH INTERNATIONAL WORKSHOP ON JUNCTION TECHNOLOGY, IWJT 2018 -2018-01-01 -2018-January
[70] Impact of high temperature H-2 pre-treatment on Pt-AlGaN/GaN HEMT sensor for H2S detection -Sensors and Actuators B-Chemical -2019-01-01 -280
[71] Pt interlayer effects on Ni germanosilicide formation and contact properties -Applied Surface Science -2009-01-01 -256
[72] Ru thin film grown on TaN by plasma enhanced atomic layer deposition -Thin Solid Films -2009-01-01 -517
[73] The effect of postannealing on the electrical properties of well-aligned n-ZnO nanorods/p-Si hete... -Journal of Applied Physics -2009-01-01 -105
[74] High-quality Ru thin film grown on TaN by plasma enhanced atomic layer deposition(PEALD) -Advanced Metallization Conference (Amc) -2009-01-01
[75] X-ray photoelectron spectroscopy study of NiSi formation on shallow junctions -Applied Surface Science -2009-01-01 -256

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